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  • Reliability Wearout Mechanisms in Advanced CMOS Technologies (IEEE Press Series on Microelectronic Systems) book cover by Alvin W. Strong, Ernest Y. Wu, Rolf-Peter Vollertsen, Jordi Sune, Giuseppe La Rosa, Timothy D. Sullivan, Stewart E. Rauch, III
    + wishlist Reliability Wearout Mechanisms in Advanced CMOS Technologies (IEEE Press Series on Microelectronic Systems) [9780471731726]
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    Alvin W. Strong Ernest Y. Wu Rolf-Peter Vollertsen Jordi Sune Giuseppe La Rosa Timothy D. Sullivan Stewart E. Rauch III
    Reliability Wearout Mechanisms in Advanced CMOS Technologies (IEEE Press Series on Microelectronic Systems) [9780471731726]
    As Low as $217.95
    Hardcover
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