+ wishlist Introduction to Spectroscopic Ellipsometry of Thin Film Materials: Instrumentation, Data Analysis, and Applications [9783527349517] Add to Cart The item has been added Author: Andrew T. S. Wee Xinmao Yin Chi Sin Tang Introduction to Spectroscopic Ellipsometry of Thin Film Materials: Instrumentation, Data Analysis, and Applications [9783527349517] Buy More - Save More. Below are the available bulk discount rates for each individual item when you purchase a certain amount Quantity Price Savings 25 - 99 15% 100 - 249 16% 250 - 499 17% 500 - 999 18% 1000+ 20% List Price As Low as $118.00 Format: Paperback
