+ wishlist Add to Cart The item has been added Author: Pierre-Richard Dahoo Philippe Pougnet Abdelkhalak El Hami Nanometer-scale Defect Detection Using Polarized Light [9781848219366] List Price As Low as $177.95 Format: Hardcover
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+ wishlist Add to Cart The item has been added Author: Pierre-Richard Dahoo Philippe Pougnet Abdelkhalak El Hami Applications and Metrology at Nanometer-Scale 2: Measurement Systems, Quantum Engineering and RBDO Method [9781786306876] List Price As Low as $177.95 Format: Hardcover