3 results for '" Philippe Pougnet"'

Name: Nanometer-scale Defect Detection Using Polarized Light [9781848219366]
SKU: 9781848219366
Price: 177.95 USD
Availability: InStock
Author: Pierre-Richard Dahoo, Philippe Pougnet, Abdelkhalak El Hami

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Pierre-Richard Dahoo Philippe Pougnet Abdelkhalak El Hami

Nanometer-scale Defect Detection Using Polarized Light [9781848219366]

As Low as $177.95

Hardcover

Applications and Metrology at Nanometer Scale 1: Smart Materials, Electromagnetic Waves and Uncertainties book cover by Pierre-Richard Dahoo, Philippe Pougnet, Abdelkhalak El Hami — + wishlist Applications and Metrology at Nanometer Scale 1: Smart Materials, Electromagnetic Waves and Uncertainties [9781786306401]
Add to Cart The item has been added

Pierre-Richard Dahoo Philippe Pougnet Abdelkhalak El Hami

Applications and Metrology at Nanometer Scale 1: Smart Materials, Electromagnetic Waves and Uncertainties [9781786306401]

As Low as $177.95

Hardcover

Applications and Metrology at Nanometer-Scale 2: Measurement Systems, Quantum Engineering and RBDO Method book cover by Pierre-Richard Dahoo, Philippe Pougnet, Abdelkhalak El Hami — + wishlist Applications and Metrology at Nanometer-Scale 2: Measurement Systems, Quantum Engineering and RBDO Method [9781786306876]
Add to Cart The item has been added

Pierre-Richard Dahoo Philippe Pougnet Abdelkhalak El Hami

Applications and Metrology at Nanometer-Scale 2: Measurement Systems, Quantum Engineering and RBDO Method [9781786306876]

As Low as $177.95

Hardcover

Quantity	Price	Savings
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Quantity	Price	Savings
25 - 99		15%
100 - 249		16%
250 - 499		17%
500 - 999		18%
1000+		20%

Quantity	Price	Savings
25 - 99		15%
100 - 249		16%
250 - 499		17%
500 - 999		18%
1000+		20%

3 results for '" Philippe Pougnet"'

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3 results for '" Philippe Pougnet"'

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