Overview
Providing a general survey of the theory of measurement error models, including the functional, structural, and ultrastructural models, this book is written in the of the Kendall and Stuart Advanced Theory of Statistics set and, like that series, includes exercises at the end of the chapters. The goal is to emphasize the ideas and practical implications of the theory in a style that does not concentrate on the theorem-proof format.The book, Statistical Regression with Measurement Error: Kendall's Library of Statistics 6 [Bulk, Wholesale, Quantity] ISBN#9780470711064 in Hardcover by Chi-Lun Cheng, John W. Van Ness may be ordered in bulk quantities. Minimum starts at 25 copies. Availability based on publisher status and quantity being ordered.
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