Nanometer-scale Defect Detection Using Polarized Light
by Pierre-Richard Dahoo, Philippe Pougnet and Abdelkhalak El Hami
$151.26 / copy at 25+ copies As low as $142.36 at 1,000+Your best volume price
Total $3,781.50
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BookPal × TalezoNanometer-scale Defect Detection Using Polarized Light
Combining experimental techniques of polarized light analysis with techniques based on theoretical or statistical models to study faults or buried interfaces of mechatronic systems, the authors define the range of validity of measurements of carbon nanotube properties. The combination of theory and pratical methods presented throughout this book provide the reader with an insight into the current understanding of physicochemical processes affecting the properties of materials at the nanoscale.
The book, Nanometer-scale Defect Detection Using Polarized Light [Bulk, Wholesale, Quantity] ISBN#9781848219366 in Hardcover by Pierre-Richard Dahoo, Philippe Pougnet, Abdelkhalak El Hami may be ordered in bulk quantities. Minimum starts at 25 copies. Availability based on publisher status and quantity being ordered.
Details
- Publisher
- Wiley
- Authors
- Pierre-Richard Dahoo, Philippe Pougnet, Abdelkhalak El Hami
- Format
- Hardcover
- Published
- Aug 22, 2016
- ISBN-13
- 9781848219366
- Pages
- 320
- Carton quantity
- 99 copies
Nanometer-scale Defect Detection Using Polarized Light for groups: pricing
Volume pricing applies automatically in your cart. No codes, no account needed.
| Copies | Price per copy | You save |
|---|---|---|
| 25 – 99 | $151.26 | 15% off list |
| 100 – 249 | $149.48 | 16% off list |
| 250 – 499 | $147.70 | 17% off list |
| 500 – 999 | $145.92 | 18% off list |
| 1,000+ | $142.36 | 20% off list |
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