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Trace-Based Post-Silicon Validation for VLSI Circuits (Lecture Notes in Electrical Engineering #252) book cover by Xiao Liu, Qiang Xu
Hardcover

Trace-Based Post-Silicon Validation for VLSI Circuits (Lecture Notes in Electrical Engineering #252)

by Xiao Liu and Qiang Xu

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Total $2,419.75

Hardcover · 108 pages Springer International Publishing · 2013

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About the book

Trace-Based Post-Silicon Validation for VLSI Circuits (Lecture Notes in Electrical Engineering #252)

This book first provides a comprehensive coverage of state-of-the-art validation solutions based on real-time signal tracing to guarantee the correctness of VLSI circuits.  The authors discuss several key challenges in post-silicon validation and provide automated solutions that are systematic and cost-effective.  A series of automatic tracing solutions and innovative design for debug (DfD) techniques are described, including techniques for trace signal selection for enhancing visibility of functional errors, a multiplexed signal tracing strategy for improving functional error detection, a tracing solution for debugging electrical errors, an interconnection fabric for increasing data bandwidth and supporting multi-core debug, an interconnection fabric design and optimization technique to increase transfer flexibility and a DfD design and associated tracing solution for improving debug efficiency and expanding tracing window. The solutions presented in this book improve the validation quality of VLSI circuits, and ultimately enable the design and fabrication of reliable electronic devices.

Details

Publisher
Springer International Publishing
Authors
Xiao Liu, Qiang Xu
Format
Hardcover
Published
Jun 27, 2013
ISBN-13
9783319005324
Pages
108
Printing
Printed on demand
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Trace-Based Post-Silicon Validation for VLSI Circuits (Lecture Notes in Electrical Engineering #252) for groups: pricing

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