Built In Test for VLSI: Pseudorandom Techniques
by Paul H. Bardell, W. H. McAnney and J. Savir
From $246.46 / copy at 25+ copies; lower per-copy prices at higher quantities (see Volume pricing) As low as $231.96 at 1,000+
Total $6,161.50
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Details
- Publisher
- Wiley
- Authors
- Paul H. Bardell, W. H. McAnney, J. Savir
- Format
- Hardcover
- Published
- Oct 20, 1987
- ISBN-13
- 9780471624639
- Pages
- 368
- Carton quantity
- 22 copies
- Printing
- Printed on demand
Built In Test for VLSI for groups: pricing
Volume pricing applies automatically in your cart. No codes, no account needed.
| Copies | Price per copy | You save |
|---|---|---|
| 25 – 99 | $246.46 | 15% off list |
| 100 – 249 | $243.56 | 16% off list |
| 250 – 499 | $240.66 | 17% off list |
| 500 – 999 | $237.76 | 18% off list |
| 1,000+ | $231.96 | 20% off list |
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Volume pricing applies automatically in your cart, with no code needed. Price per copy: 25 to 99 copies, $246.46 (15% off list); 100 to 249 copies, $243.56 (16% off list); 250 to 499 copies, $240.66 (17% off list); 500 to 999 copies, $237.76 (18% off list); 1,000+ copies, $231.96 (20% off list). Need a different quantity, or a quote to forward for approval? Ask a specialist and we will confirm pricing before you pay.
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