Electromigration Inside Logic Cells: Modeling, Analyzing and Mitigating Signal Electromigration in NanoCMOS
by Gracieli Posser, Sachin S. Sapatnekar and Ricardo Reis
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This book describes new and effective methodologies for modeling, analyzing and mitigating cell-internal signal electromigration in nanoCMOS, with significant circuit lifetime improvements and no impact on performance, area and power. The authors are the first to analyze and propose a solution for the electromigration effects inside logic cells of a circuit. They show in this book that an interconnect inside a cell can fail reducing considerably the circuit lifetime and they demonstrate a methodology to optimize the lifetime of circuits, by placing the output, Vdd and Vss pin of the cells in the less critical regions, where the electromigration effects are reduced. Readers will be enabled to apply this methodology only for the critical cells in the circuit, avoiding impact in the circuit delay, area and performance, thus increasing the lifetime of the circuit without loss in other characteristics.
The book, Electromigration Inside Logic Cells: Modeling, Analyzing and Mitigating Signal Electromigration in NanoCMOS [Bulk, Wholesale, Quantity] ISBN#9783319488981 in Hardcover by Gracieli Posser, Sachin S. Sapatnekar, Ricardo Reis may be ordered in bulk quantities. Minimum starts at 25 copies. Availability based on publisher status and quantity being ordered.
Details
- Publisher
- Springer International Publishing
- Authors
- Gracieli Posser, Sachin S. Sapatnekar, Ricardo Reis
- Format
- Hardcover
- Published
- Dec 16, 2016
- ISBN-13
- 9783319488981
- Pages
- 118
- Printing
- Printed on demand
Electromigration Inside Logic Cells in bulk: pricing
Volume pricing applies automatically in your cart. No codes, no account needed.
| Copies | Price per copy | You save |
|---|---|---|
| 25 – 49 | $48.39 | 12% off list |
| 50 – 99 | $47.84 | 13% off list |
| 100+ | $47.29 | 14% off list |
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