High Performance Memory Testing: Design Principles, Fault Modeling and Self-Test (Frontiers in Electronic Testing #22A)
by R. Dean Adams
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BookPal × TalezoHigh Performance Memory Testing
Are memory applications more critical than they have been in the past? Yes, but even more critical is the number of designs and the sheer number of bits on each design. It is assured that catastrophes, which were avoided in the past because memories were small, will easily occur if the design and test engineers do not do their jobs very carefully.
High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is based on the author's 20 years of experience in memory design, memory reliability development and memory self test.
High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is written for the professional and the researcher to help them understand the memories that are being tested.
The book, High Performance Memory Testing: Design Principles, Fault Modeling and Self-Test (Frontiers in Electronic Testing #22A) [Bulk, Wholesale, Quantity] ISBN#9781475784749 in Paperback by R. Dean Adams may be ordered in bulk quantities. Minimum starts at 25 copies. Availability based on publisher status and quantity being ordered.
Details
- Publisher
- Springer US
- Author
- R. Dean Adams
- Format
- Paperback
- Published
- Apr 26, 2013
- ISBN-13
- 9781475784749
- Pages
- 250
- Printing
- Printed on demand
High Performance Memory Testing in bulk: pricing
Volume pricing applies automatically in your cart. No codes, no account needed.
| Copies | Price per copy | You save |
|---|---|---|
| 25 – 49 | $149.59 | 12% off list |
| 50 – 99 | $147.89 | 13% off list |
| 100+ | $146.19 | 14% off list |
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High Performance Memory Testing: Design Principles, Fault Modeling and Self-Test (Frontiers in Electronic Testing #22A) [9781475784749]
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