Overview
This book will introduce new techniques for detecting and diagnosing small-delay defects in integrated circuits. Although this sort of timing defect is commonly found in integrated circuits manufactured with nanometer technology, this will be the first book to introduce effective and scalable methodologies for screening and diagnosing small-delay defects, including important parameters such as process variations, crosstalk, and power supply noise.The book, Test and Diagnosis for Small-Delay Defects [Bulk, Wholesale, Quantity] ISBN#9781441982964 in Hardcover by Mohammad Tehranipoor, Ke Peng, Krishnendu Chakrabarty may be ordered in bulk quantities. Minimum starts at 25 copies. Availability based on publisher status and quantity being ordered.
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